The X-ray diffraction (XRD) pattern was obtained on a Thermo ARL XTRA X-ray diffractometer with Cu K radiation ì 1.54178 Å). In situ XRD characterization was performed n a high-temperature attachment of the X-ray diffractometer. ... The X-ray diffraction (XRD) pattern was obtained on a
Thermo ARL XTRA X-ray diffractometer with Cu K radiation
ì 1.54178 Å). In situ XRD characterization was performed
n a high-temperature attachment of the X-ray diffractometer.
Transmission electron microscopy (TEM) observation was
performed with a JEOL JEM 2010 high-resolution transmission
electron microscope (HRTEM) operated at 200 kV. The UV
vis diffuse reflectance spectrum (DRS) was obtained from a
Perkin-Elmer Lambda 900 UV vis spectroscopy machine. The
precursor was characterized by Fourier transform infrared (FT-
R) spectroscopy on a Perkin-Elmer Spectrum One FT-IR
machine by using the KBr pellets method.
Cu K 放射物可以在热电的ARL XTRA X射线衍射仪上得到光绕射图案。
原位XRD表征应该在高温连接X-Ray衍射仪下体现。
透射电子显微镜法应该在a JEOL JEM 2010 高分辨透射电子显微镜 200KV下进行。
紫外-可见分光光度法 可从Perkin-Elmer Lambda 900 紫外-可见光光谱机上获得。
前体以通过使用KBr 颗粒的方法在a Perkin-Elmer Spectrum One 红外光谱机上呈现傅里叶变换红外线光谱为特征。
我想知道 搂着给出的英文是一段连贯的文字吗?