diCaliber AFM高级应用系列-力谱及局部机械性能分析

The ability of atomic force microscopy (AFM) to create three-dimensional micrographs with nanometer resolution has made it an essential tool in applications ranging from semiconductor processing to biology. In addition to this topographical imaging, the AFM can also probe nanomechanical and other fundamental properties of sample surfaces, including their local adhesive or elastic (compliance) properties. DI Caliber 扫描探针显微镜