尼康工业CT-广州菘康机电设备有限公司

详细信息


1.	SYSTEM CONCEPT系统描述


1.1	GENERAL OVERVIEW

	The XT H 225 is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes.The system operates between 20 and 225 kV providing a flexible tool for quality laboratories, production facilities and research departments. XT H 225是电脑断层CT扫描系统适合多种材料和样品尺寸.系统运行电压在20-225KV之间,能灵活的应用于质量控制实验室,生产车间和研发部门.

	The inspection task includes visualization and structural analysis. 检测任务中还包括了图像分析和结构分析。

	·	high performance, high reliability高性能高稳定性
	·	standard components used, optimized serviceability标准元器件，优化的适用性


1.2	SYSTEM ADVANTAGES系统优点

	Industrial System Layout工业系统设计规划
	·	Easy and fast installation and commissioning安装调试简单快速
	·	Optimized footprint, minimum floor requirements，Long life open X-ray tube – with low cost consumables.Planned maintenance schedule throughout system life.优化设计使占地面积最小


	Fit-to-Application Product特殊应用定制产品
	·	Layout and design will be based on Application Study results基于对应用要求的研究结果的设计和规划
	·	Customized solution: Fulfils individual requirements定制方案：满足特殊要求

	Optimised choice of Detector探测器系统的优化选择
	·	Allows fast scans with high image quality and contrast resolution可进行快速扫描并得到高品质高对比度灵敏度的图像
	·	Minimizes system size and shielding requirements最小的系统外形尺寸和射线防护要求

	Windows-based operator guiding system视窗基础的用户界面
	·	Short learning curve – operational within 3 days
	·	CT wizard™ guides an operator easily through the data Acquisition
	·	Improved failure analysis capability through 5 axis component manipulator.
		Local language support
		Operator and supervisor control modes

1.3	CT MAIN PARAMETERS系统主要技术指标

	Object capability 工件尺寸		Outer diameter外直径	<200 mm
			Effective scan height 有效扫描高度	<160 mm

	Operation modes 操作模式		CT	Volume Scan (Cone beam geometry) 容积扫描（锥束扫描）
			DR	Digital Radiography 数字成像

	Scan time 扫描时间		CT	typ. 10 … 30 min （High Resolution Scan）典型高精度扫描，30分钟
			DR	最大maximum 15 frames/sec 1x1 binning 25 frames/sec 2x2 binning

	Pixel size像素尺寸			127x127µm²
	Magnification放大倍数			Up to 150-fold

·	High image quality even at fast 3D scans: optimized geometry 在快速3-D扫描时也可以实现高图像品质
·	Objects can be scanned with continuous rotation: no vibrations, no time consuming Stop & Go mode 物体在扫描时连续旋转：无振动，节省扫描时间

产品优势

XT V系统范围具有亚微米特征识别功能，可满足当今对复杂电子元件进行高性能、无损检测的需要。尼康Xi Nanotech X射线源与业界领先的平板探测器相配，可产生一流的图像质量，并在2D和3D检测之间实现无缝转换。提高所有操作员的生产效率，同时减少培训需求。XT V检测系统具有亚微米特征识别功能，适用于广泛的应用和行业，包括PCB组装、BGA检测、芯片设计、医疗和汽车零部件制造、航空航天、消费品等。