广州菘康机电设备有限公司
广州菘康机电设备有限公司

尼康工业CT



1.

SYSTEM CONCEPT系统描述





1.1

GENERAL OVERVIEW




The XT H 225 is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes.The system operates between 20 and 225 kV providing a flexible tool for quality laboratories, production facilities and research departments. XT H 225是电脑断层CT扫描系统适合多种材料 和样品尺寸.系统运行电压在20-225KV之间,能灵活的应用于质量控制实验室,生产车间和研发部门.




The inspection task includes visualization and structural analysis.

检测任务中还包括了图像分析和结构分析。




·

high performance, high reliability高性能高稳定性


·

standard components used, optimized serviceability标准元器件,优化的适用性





1.2

SYSTEM ADVANTAGES系统优点




Industrial System Layout工业系统设计规划


·

Easy and fast installation and commissioning安装调试简单快速


·

Optimized footprint, minimum floor requirements,Long life open X-ray tube – with low cost consumables.Planned maintenance schedule throughout system life.优化设计使占地面积最小








Fit-to-Application Product特殊应用定制产品


·

Layout and design will be based on Application Study results基于对应用要求的研究结果的设计和规划


·

Customized solution: Fulfils individual requirements定制方案:满足特殊要求





Optimised choice of  Detector探测器系统的优化选择


·

Allows fast scans with high image quality and contrast resolution可进行快速扫描并得到高品质高对比度灵敏度的图像


·

Minimizes system size and shielding requirements最小的系统外形尺寸和射线防护要求





Windows-based operator guiding system视窗基础的用户界面


·

Short learning curve – operational within 3 days


·

CT wizard™ guides an operator easily through the data

Acquisition


·

Improved failure analysis capability through 5 axis

component manipulator.



Local language support



Operator and supervisor control modes



1.3

CT MAIN PARAMETERS系统主要技术指标




Object capability

工件尺寸

Outer diameter外直径

<200 mm


Effective scan height

有效扫描高度 

<160 mm






Operation modes

操作模式

CT

Volume Scan (Cone beam geometry)

容积扫描(锥束扫描)



DR

Digital Radiography

数字成像






Scan time

扫描时间

CT

typ. 10 … 30 min (High Resolution Scan)

典型高精度扫描,30分钟



DR

最大maximum 15 frames/sec 1x1 binning

25 frames/sec 2x2 binning






Pixel size像素尺寸


127x127µm²


Magnification放大倍数


Up to 150-fold

 




·

High image quality even at fast 3D scans: optimized geometry

在快速3-D扫描时也可以实现高图像品质

·

Objects can be scanned with continuous rotation: no vibrations, no time consuming Stop & Go mode

物体在扫描时连续旋转:无振动,节省扫描时间


XT V系统范围具有亚微米特征识别功能,可满足当今对复杂电子元件进行高性能、无损检测的需要。尼康Xi Nanotech X射线源与业界领先的平板探测器相配,可产生一流的图像质量,并在2D和3D检测之间实现无缝转换。提高所有操作员的生产效率,同时减少培训需求。XT V检测系统具有亚微米特征识别功能,适用于广泛的应用和行业,包括PCB组装、BGA检测、芯片设计、医疗和汽车零部件制造、航空航天、消费品等。

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