GDDR7 Memory Test System

M5512 GDDR7 Memory Test System

ATE-on-Bench for GDDR7 Characterization and Test

BENEFITS

Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications

Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pin-electronics exceed the requirements of the GDDR7 specifications

Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards

深圳市锐测电子科技（Reetest）专注于提供针对各种芯片总线接口协议/Serdes/器件/系统级产品从物理层至协议层的测试解决方案，覆盖R&D测试验证，RDT可靠性测试，芯片量产测试, AE/FAE等各个产品生命周期的测试。公司针对每一个产品线均有配备非常专业且富有经验的技术支持工程师提供local的产品售前售后技术支持服务。