固态材料图像分析研究

Quantitative Image Analysis, Part I Principles Dennis W. Hetzner Research Specialist The Timken Company Canton, OH Editor: George Vander Voort Director, Research and Technology, Buehler Editors Note: We are extremely fortunate to have Dr. Dennis Hetzner, Research Specialist at The Timken Company, and longtime ASTM E-4 associate, to provide us with this valuable introduction to image analysis principles;and, in a future issue, applications.Todays automated image analysis system is the culmination of developments from over a 100 year period. After the first microscopes were created, one of the next logical questions to follow was how big was a particular feature or how much of some constituent was present. From these questions, quantitative microscopy had its roots. The next logical question to arise was how to relate observations made from two dimensional fields of view to three dimensions; this analysis is termed stereology. Initially, the procedures developed to perform stereological measurements were based on laborious time. OmniMet 模块数字图像系统