HITACHI FlexSEM 1000-柯岷国际贸易(上海)有限公司

详细信息

低真空可描式子微 FlexSEM 1000 Scanning Electron Microscope FlexSEM 1000 精的安空, 也可分解安於一般桌面全新自子位校正功能，自行全新的低像差子光系，提升量及解析度高速PD-BSE 器，可於快速描模式下察BSE影像全新直式人介面，搭配 “SEM MAP “ 光航功能Windows 10 作系可搭EDS系 (OXFOR X-act / EDAX ELEMENT相容)

The FlexSEM 1000 is a compact variable-pressure SEM that delivers the performance of a conventional SEM in a lab-friendly footprint, and requires only a standard wall outlet for power. The FlexSEM will change your view of electron microscopy! Overview Best-in-class resolution in a compact system. The FlexSEM has employed a newly designed electrical optical system and reliability-proven high-sensitivity detector, achieving imaging at 4 nm. Novel low vacuum technologies enable observation of non-conductive specimens without preprocessing. The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience level. Specifically, the new and enhanced navigation function, SEM MAP, helps locate the regions of interest quickly, and delivers accurate correlated optical and SEM images using only one click. Features COMPACT SLIM BODY A compact design (450 mm wide) minimizes system footprint. The Main unit can be separated from the Power Supply unit for flexible system placement. Requires only a standard wall outlet for power. UNPARALLELED IMAGE QUALITY The newly developed electron optical column or Ultra Variable-Pressure Detector (UVD) enables superior imaging of specimen surfaces at low accelerating voltages and low vacuum conditions. Sample: Cement Magnification: 40,000x Accelerating Voltage: 3 kV Signal: Secondary Electron (SE) Without metal coating Sample: ZnO Magnification: 150,000x Accelerating Voltage: 5 kV Signal: Secondary Electron (SE) Without metal coating Sample: Polymer Cross Section Magnification: 13,000x Accelerating Voltage: 5 kV Vacuum: 50 Pa Signal: Ultra Variable-Pressure Detector (UVD) Without metal coating INTUITIVE OPERATION The user-friendly GUI as well as accurate and fast AFC (Auto Focus Control) and ABCC (Auto Brightness and Contrast Control) algorithms, which take only 5sec, enable optimized imaging performance with minimal time and effort. NEW CAMERA NAVIGATION - 'SEM MAP' The 'SEM MAP' function makes traversing across an entire specimen effortless. Navigate your sample with the use of an optical camera, and deliver accurate correlated Optical and SEM images using only one click.