| 资料简介： | |
| Nanoscale mapping is achieved by multi-modal correlative microscopy combining focused ion beam and scanning electron microscopy (FIB-SEM) with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS).Mapping Li, Mn and Co nanoscale distributions reveals the micro-structural consequences of the electrochemical reaction, and allows identifying Li “trapping” sites within the structure |
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