多层膜型XRF分析晶体

Multilayers XS-55, XS-N, XS-C, XS-B

Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d

are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers

are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light

elements the multilayer technique presents an almost revolutionary improvement for numerous

applications in comparison to natural crystals with large lattice plane distances.

Fig. 18: Diffraction in the layers of a multilayer crystal

XS-55:

The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca

to Br; standard application for measuring the elements F, Na and Mg.