微区XRF（X射线分析显微镜）的指纹图像

微区XRF（X射线分析显微镜）的指纹图像
The fast and non-destructive elemental analysis
provided by x-ray fluorescence (XRF), has long
been known as a useful tool for forensic science.
As microscopic capabilities in the technique have
advanced, so its suitability to forensic analysis has
increased, now allowing accurate analysis of
minute material fragments (see Figure 1) such as
paint chips, metals, glasses, and gun shot residues.
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