?PP-TOFMS Depth Profi领 of ZnO Thin layers co-dope

This example shows that PP-TOFMS is a fast and reliable technique for depth profi领 of rare earth doped ZnO thin films. Tb and Eu prof les are obtained with high sensitivity and high depth resolution. This type of information is typically provided by SIMS, RBS or depth profi领 XPS but not as rapidly and readily and at a higher cost. Such profiles turn out to be powerful complementary information to understand photoluminescence data. HORIBA等离子体分析飞行时间质谱仪PP-TOFMS