Advanced Nanoscale Characterization with diCaliber-P

TappingModeTM imaging has proved to be the most versatile mode of atomic force microscopy (AFM) in ambient conditions where the presence of a fl uid layer (condensed water vapor and other contaminants) severely limits the applicability of both contact mode and non-contact techniques. Overcoming the challenges posed by friction, adhesion, and other issues, TappingMode has provided a means of greatly extending AFM applications. DI Caliber 扫描探针显微镜